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50-445: ETO may refer to: Science and technology [ edit ] Emitter turn off thyristor , a semiconductor device Ethylene oxide , an organic compound RUNX1T1 , a gene Efforts to Outcomes, software produced by Social Solutions Sports [ edit ] ETO-SZESE Győr FKC , a Hungarian handball club Győri Audi ETO KC , a Hungarian women's handball club ETO Park ,

100-429: A depletion layer by forcing the positively charged holes away from the gate-insulator/semiconductor interface, leaving exposed a carrier-free region of immobile, negatively charged acceptor ions (see doping ). If V G is high enough, a high concentration of negative charge carriers forms in an inversion layer located in a thin layer next to the interface between the semiconductor and the insulator. Conventionally,

150-551: A MOSFET. In the case of a p-type MOSFET, bulk inversion happens when the intrinsic energy level at the surface becomes smaller than the Fermi level at the surface. This can be seen on a band diagram. The Fermi level defines the type of semiconductor in discussion. If the Fermi level is equal to the Intrinsic level, the semiconductor is of intrinsic, or pure type. If the Fermi level lies closer to

200-535: A bipolar transistor. The subthreshold I–V curve depends exponentially upon threshold voltage, introducing a strong dependence on any manufacturing variation that affects threshold voltage; for example: variations in oxide thickness, junction depth, or body doping that change the degree of drain-induced barrier lowering. The resulting sensitivity to fabricational variations complicates optimization for leakage and performance. When V GS > V th and V DS < V GS  − V th : The transistor

250-404: A buried oxide is formed below a thin semiconductor layer. If the channel region between the gate dielectric and the buried oxide region is very thin, the channel is referred to as an ultrathin channel region with the source and drain regions formed on either side in or above the thin semiconductor layer. Other semiconductor materials may be employed. When the source and drain regions are formed above

300-415: A long turn-off tail of current at the end of the turn-off and the next turn-on must wait until the residual charge on the anode side is dissipated through the recombination process. MOSFET The main advantage of a MOSFET is that it requires almost no input current to control the load current, when compared to bipolar junction transistors (BJTs). In an enhancement mode MOSFET, voltage applied to

350-476: A long-channel device, there is no drain voltage dependence of the current once V DS ≫ V T {\displaystyle V_{\text{DS}}\gg V_{\text{T}}} , but as channel length is reduced drain-induced barrier lowering introduces drain voltage dependence that depends in a complex way upon the device geometry (for example, the channel doping, the junction doping and so on). Frequently, threshold voltage V th for this mode

400-796: A multi-use stadium in Győr, Hungary Stadion ETO , the predecessor of ETO Park Other [ edit ] Electro-technical officer , on a merchant ship Engineer to order , in supply chain management English Touring Opera , an opera company in the United Kingdom Eton language , a Bantu language European Theatre of Operations, the European theatre of World War II European Theater of Operations, United States Army , an American theater of operations in World War II Earth-Trisolaris Organization, an organization in

450-480: A silicon MOS transistor in 1959 and successfully demonstrated a working MOS device with their Bell Labs team in 1960. Their team included E. E. LaBate and E. I. Povilonis who fabricated the device; M. O. Thurston, L. A. D’Asaro, and J. R. Ligenza who developed the diffusion processes, and H. K. Gummel and R. Lindner who characterized the device. This was a culmination of decades of field-effect research that began with Lilienfeld. The first MOS transistor at Bell Labs

500-507: A similar device in Europe. In the 1940s, Bell Labs scientists William Shockley , John Bardeen and Walter Houser Brattain attempted to build a field-effect device, which led to their discovery of the transistor effect. However, the structure failed to show the anticipated effects, due to the problem of surface states : traps on the semiconductor surface that hold electrons immobile. With no surface passivation , they were only able to build

550-625: Is a type of thyristor that uses a MOSFET to turn on and turn off. It combines the advantages of both the GTO and MOSFET. It has two gates - one normal gate for turn on and one with a series MOSFET for turn off. The first generation ETO was developed by Prof. Alex Q. Huang in the Center for Power Electronics, Virginia Tech, in 1996. Although the ETO concept was demonstrated, the first-generation ETO had limitations that prevented high-power applications. The device rating

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600-748: Is a weak-inversion current, sometimes called subthreshold leakage. In weak inversion where the source is tied to bulk, the current varies exponentially with V GS {\displaystyle V_{\text{GS}}} as given approximately by: I D ≈ I D0 e V GS − V th n V T , {\displaystyle I_{\text{D}}\approx I_{\text{D0}}e^{\frac {V_{\text{GS}}-V_{\text{th}}}{nV_{\text{T}}}},} where I D0 {\displaystyle I_{\text{D0}}} = current at V GS = V th {\displaystyle V_{\text{GS}}=V_{\text{th}}} ,

650-503: Is applied to the MOSFET connected to the cathode, it turns off and transfers all the current away from the cathode (N-emitter of the NPN transistor in the thyristor) into the base gate via MOSFET connected to the gate of the thyristor. This stops regenerative latching process and results in a fast turn-off. Both the MOSFET connected to the cathode and MOSFET connected to the gate of the thyristor

700-501: Is by far the most common transistor in digital circuits, as billions may be included in a memory chip or microprocessor. Since MOSFETs can be made with either p-type or n-type semiconductors, complementary pairs of MOS transistors can be used to make switching circuits with very low power consumption, in the form of CMOS logic . The basic principle of the field-effect transistor was first patented by Julius Edgar Lilienfeld in 1925. In 1934, inventor Oskar Heil independently patented

750-709: Is defined as the gate voltage at which a selected value of current I D0 occurs, for example, I D0 = 1   μA, which may not be the same V th -value used in the equations for the following modes. Some micropower analog circuits are designed to take advantage of subthreshold conduction. By working in the weak-inversion region, the MOSFETs in these circuits deliver the highest possible transconductance-to-current ratio, namely: g m / I D = 1 / ( n V T ) {\displaystyle g_{m}/I_{\text{D}}=1/\left(nV_{\text{T}}\right)} , almost that of

800-415: Is equivalent to a planar capacitor , with one of the electrodes replaced by a semiconductor. When a voltage is applied across a MOS structure, it modifies the distribution of charges in the semiconductor. If we consider a p-type semiconductor (with N A the density of acceptors , p the density of holes; p = N A in neutral bulk), a positive voltage, V G , from gate to body (see figure) creates

850-400: Is not subjected to high-voltage stresses irrespective of the magnitude of the voltage on the ETO, due to the internal structure of the thyristor containing a P-N junction . The drawback of connecting a MOSFET in series is that it has to carry the main thyristor current, and it also increases the total voltage drop by about 0.3 to 0.5V and its corresponding losses. Similar to a GTO , the ETO has

900-501: Is the charge-carrier effective mobility, W {\displaystyle W} is the gate width, L {\displaystyle L} is the gate length and C ox {\displaystyle C_{\text{ox}}} is the gate oxide capacitance per unit area. The transition from the exponential subthreshold region to the triode region is not as sharp as the equations suggest. When V GS > V th and V DS ≥ (V GS  – V th ): The switch

950-787: Is turned on, and a channel has been created which allows current between the drain and the source. The MOSFET operates like a resistor, controlled by the gate voltage relative to both the source and drain voltages. The current from drain to source is modeled as: I D = μ n C ox W L ( ( V GS − V t h ) V DS − V DS 2 2 ) {\displaystyle I_{\text{D}}=\mu _{n}C_{\text{ox}}{\frac {W}{L}}\left(\left(V_{\text{GS}}-V_{\rm {th}}\right)V_{\text{DS}}-{\frac {{V_{\text{DS}}}^{2}}{2}}\right)} where μ n {\displaystyle \mu _{n}}

1000-427: Is turned on, and a channel has been created, which allows current between the drain and source. Since the drain voltage is higher than the source voltage, the electrons spread out, and conduction is not through a narrow channel but through a broader, two- or three-dimensional current distribution extending away from the interface and deeper in the substrate. The onset of this region is also known as pinch-off to indicate

1050-447: The 45 nanometer node. When a voltage is applied between the gate and the source, the electric field generated penetrates through the oxide and creates an inversion layer or channel at the semiconductor-insulator interface. The inversion layer provides a channel through which current can pass between source and drain terminals. Varying the voltage between the gate and body modulates the conductivity of this layer and thereby controls

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1100-452: The BJT and thyristor transistors. In 1955, Carl Frosch and Lincoln Derick accidentally grew a layer of silicon dioxide over the silicon wafer, for which they observed surface passivation effects. By 1957 Frosch and Derick, using masking and predeposition, were able to manufacture silicon dioxide field effect transistors; the first planar transistors, in which drain and source were adjacent at

1150-432: The Fermi level and when the voltage reaches the threshold voltage, the intrinsic level does cross the Fermi level, and that is what is known as inversion. At that point, the surface of the semiconductor is inverted from p-type into n-type. If the Fermi level lies above the intrinsic level, the semiconductor is of n-type, therefore at inversion, when the intrinsic level reaches and crosses the Fermi level (which lies closer to

1200-410: The addition of n-type source and drain regions. The MOS capacitor structure is the heart of the MOSFET. Consider a MOS capacitor where the silicon base is of p-type. If a positive voltage is applied at the gate, holes which are at the surface of the p-type substrate will be repelled by the electric field generated by the voltage applied. At first, the holes will simply be repelled and what will remain on

1250-448: The body) are highly doped as signified by a "+" sign after the type of doping. If the MOSFET is an n-channel or nMOS FET, then the source and drain are n+ regions and the body is a p region. If the MOSFET is a p-channel or pMOS FET, then the source and drain are p+ regions and the body is a n region. The source is so named because it is the source of the charge carriers (electrons for n-channel, holes for p-channel) that flow through

1300-406: The channel in whole or in part, they are referred to as raised source/drain regions. The operation of a MOSFET can be separated into three different modes, depending on the voltages at the terminals. In the following discussion, a simplified algebraic model is used. Modern MOSFET characteristics are more complex than the algebraic model presented here. For an enhancement-mode, n-channel MOSFET ,

1350-408: The channel; similarly, the drain is where the charge carriers leave the channel. The occupancy of the energy bands in a semiconductor is set by the position of the Fermi level relative to the semiconductor energy-band edges. With sufficient gate voltage, the valence band edge is driven far from the Fermi level, and holes from the body are driven away from the gate. At larger gate bias still, near

1400-414: The conduction band (valence band) then the semiconductor type will be of n-type (p-type). When the gate voltage is increased in a positive sense (for the given example), this will shift the intrinsic energy level band so that it will curve downwards towards the valence band. If the Fermi level lies closer to the valence band (for p-type), there will be a point when the Intrinsic level will start to cross

1450-422: The current flow between drain and source. This is known as enhancement mode. The traditional metal–oxide–semiconductor (MOS) structure is obtained by growing a layer of silicon dioxide ( SiO 2 ) on top of a silicon substrate, commonly by thermal oxidation and depositing a layer of metal or polycrystalline silicon (the latter is commonly used). As silicon dioxide is a dielectric material, its structure

1500-731: The depletion layer and C ox {\displaystyle C_{\text{ox}}} = capacitance of the oxide layer. This equation is generally used, but is only an adequate approximation for the source tied to the bulk. For the source not tied to the bulk, the subthreshold equation for drain current in saturation is I D ≈ I D0 e V G − V th n V T e − V S V T . {\displaystyle I_{\text{D}}\approx I_{\text{D0}}e^{\frac {V_{\text{G}}-V_{\text{th}}}{nV_{\text{T}}}}e^{-{\frac {V_{\text{S}}}{V_{\text{T}}}}}.} In

1550-464: The device may be referred to as a metal-insulator-semiconductor FET (MISFET). Compared to the MOS capacitor, the MOSFET includes two additional terminals ( source and drain ), each connected to individual highly doped regions that are separated by the body region. These regions can be either p or n type, but they must both be of the same type, and of opposite type to the body region. The source and drain (unlike

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1600-468: The effect of thermal energy on the Fermi–Dirac distribution of electron energies which allow some of the more energetic electrons at the source to enter the channel and flow to the drain. This results in a subthreshold current that is an exponential function of gate-source voltage. While the current between drain and source should ideally be zero when the transistor is being used as a turned-off switch, there

1650-424: The electron is now fixed onto the atom and immobile. As the voltage at the gate increases, there will be a point at which the surface above the depletion region will be converted from p-type into n-type, as electrons from the bulk area will start to get attracted by the larger electric field. This is known as inversion . The threshold voltage at which this conversion happens is one of the most important parameters in

1700-413: The gate leads to a higher electron density in the inversion layer and therefore increases the current flow between the source and drain. For gate voltages below the threshold value, the channel is lightly populated, and only a very small subthreshold leakage current can flow between the source and the drain. When a negative gate-source voltage (positive source-gate) is applied, it creates a p-channel at

1750-476: The gate terminal increases the conductivity of the device. In depletion mode transistors, voltage applied at the gate reduces the conductivity. The "metal" in the name MOSFET is sometimes a misnomer , because the gate material can be a layer of polysilicon (polycrystalline silicon). Similarly, "oxide" in the name can also be a misnomer, as different dielectric materials are used with the aim of obtaining strong channels with smaller applied voltages. The MOSFET

1800-408: The gate voltage at which the volume density of electrons in the inversion layer is the same as the volume density of holes in the body is called the threshold voltage . When the voltage between transistor gate and source ( V G ) exceeds the threshold voltage ( V th ), the difference is known as overdrive voltage . This structure with p-type body is the basis of the n-type MOSFET, which requires

1850-417: The increase in power consumption due to gate current leakage, a high-κ dielectric is used instead of silicon dioxide for the gate insulator, while polysilicon is replaced by metal gates (e.g. Intel , 2009). The gate is separated from the channel by a thin insulating layer, traditionally of silicon dioxide and later of silicon oxynitride . Some companies use a high-κ dielectric and metal gate combination in

1900-818: The lack of channel region near the drain. Although the channel does not extend the full length of the device, the electric field between the drain and the channel is very high, and conduction continues. The drain current is now weakly dependent upon drain voltage and controlled primarily by the gate-source voltage, and modeled approximately as: I D = μ n C ox 2 W L [ V GS − V th ] 2 [ 1 + λ V DS ] . {\displaystyle I_{\text{D}}={\frac {\mu _{n}C_{\text{ox}}}{2}}{\frac {W}{L}}\left[V_{\text{GS}}-V_{\text{th}}\right]^{2}\left[1+\lambda V_{\text{DS}}\right].} The additional factor involving λ,

1950-467: The novel The Three-Body Problem See also [ edit ] [REDACTED] Search for "eto" , "e-to" , "et-o" , or "e-t-o" on Misplaced Pages. Eto , a Japanese name All pages with titles beginning with Eto All pages with titles beginning with ETO All pages with titles containing ETO Topics referred to by the same term [REDACTED] This disambiguation page lists articles associated with

2000-490: The preprint of their article in December 1956 to all his senior staff, including Jean Hoerni , who would later invent the planar process in 1959 while at Fairchild Semiconductor . After this, J.R. Ligenza and W.G. Spitzer studied the mechanism of thermally grown oxides, fabricated a high quality Si/ SiO 2 stack and published their results in 1960. Following this research, Mohamed Atalla and Dawon Kahng proposed

2050-404: The same surface. They showed that silicon dioxide insulated, protected silicon wafers and prevented dopants from diffusing into the wafer. At Bell Labs, the importance of Frosch and Derick technique and transistors was immediately realized. Results of their work circulated around Bell Labs in the form of BTL memos before being published in 1957. At Shockley Semiconductor , Shockley had circulated

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2100-399: The semiconductor surface the conduction band edge is brought close to the Fermi level, populating the surface with electrons in an inversion layer or n-channel at the interface between the p region and the oxide. This conducting channel extends between the source and the drain, and current is conducted through it when a voltage is applied between the two electrodes. Increasing the voltage on

2150-418: The surface of the n region, analogous to the n-channel case, but with opposite polarities of charges and voltages. When a voltage less negative than the threshold value (a negative voltage for the p-channel) is applied between gate and source, the channel disappears and only a very small subthreshold current can flow between the source and the drain. The device may comprise a silicon on insulator device in which

2200-410: The surface will be immobile (negative) atoms of the acceptor type, which creates a depletion region on the surface. A hole is created by an acceptor atom, e.g., boron, which has one less electron than a silicon atom. Holes are not actually repelled, being non-entities; electrons are attracted by the positive field, and fill these holes. This creates a depletion region where no charge carriers exist because

2250-417: The thermal voltage V T = k T / q {\displaystyle V_{\text{T}}=kT/q} and the slope factor n is given by: n = 1 + C dep C ox , {\displaystyle n=1+{\frac {C_{\text{dep}}}{C_{\text{ox}}}},} with C dep {\displaystyle C_{\text{dep}}} = capacitance of

2300-443: The three operational modes are: When V GS < V th : where V GS {\displaystyle V_{\text{GS}}} is gate-to-source bias and V th {\displaystyle V_{\text{th}}} is the threshold voltage of the device. According to the basic threshold model, the transistor is turned off, and there is no conduction between drain and source. A more accurate model considers

2350-489: The title ETO . If an internal link led you here, you may wish to change the link to point directly to the intended article. Retrieved from " https://en.wikipedia.org/w/index.php?title=ETO&oldid=1248015933 " Category : Disambiguation pages Hidden categories: Short description is different from Wikidata All article disambiguation pages All disambiguation pages Emitter turn off thyristor The Emitter Turn Off Thyristor (ETO)

2400-421: The valence band), the semiconductor type changes at the surface as dictated by the relative positions of the Fermi and Intrinsic energy levels. A MOSFET is based on the modulation of charge concentration by a MOS capacitance between a body electrode and a gate electrode located above the body and insulated from all other device regions by a gate dielectric layer. If dielectrics other than an oxide are employed,

2450-748: Was about 100 times slower than contemporary bipolar transistors and was initially seen as inferior. Nevertheless, Kahng pointed out several advantages of the device, notably ease of fabrication and its application in integrated circuits . Usually the semiconductor of choice is silicon . Some chip manufacturers, most notably IBM and Intel , use an alloy of silicon and germanium ( SiGe ) in MOSFET channels. Many semiconductors with better electrical properties than silicon, such as gallium arsenide , do not form good semiconductor-to-insulator interfaces, and thus are not suitable for MOSFETs. Research continues on creating insulators with acceptable electrical characteristics on other semiconductor materials. To overcome

2500-528: Was later improved to 4500V/4000A. An ETO is turned ON by applying positive voltages to gates , gate 1, and gate 2. When a positive voltage is applied to gate 2, it turns on the MOSFET that is connected in series with the cathode terminal of the PNPN thyristor structure. The positive voltage applied to gate 1 turns off the MOSFET connected to the gate terminal of the thyristor. When a turn-off negative voltage signal

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